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  HomeContents of Chinese Journal of Mechanical Engineering 2005 No.1SUB-PIXEL EDGE DETECTION METHOD FOR SLM COLOR MICROSCOPIC IMAGES
SUB-PIXEL EDGE DETECTION METHOD FOR

SLM COLOR MICROSCOPIC IMAGES

 

Liu Chong  Xia Zeyi

(Research Center for Micro-system Technology, Dalian University of Technology, Dalian 116024)

Pei Wei  Niyokindi Salvator

(Key Laboratory for Precision & Non-traditional Machining Technology of Ministry of Education, Dalian University of Technology, Dalian 116024)

 

Abstract: The great development in micromanipulation technology has exigent request to develop image processing for the microscopic image. According to the characteristic of the SLM color microscopic image in micromanipulation imaging system, a method for edge detection based on wavelet transformation and HSI is proposed. Then, the interested area of the image is interpolated using cubic spline and accurate sub-pixel edges are obtained based on the zero point of first-order derivatives of cubic spline curve. The experiment result shows that this method is effective for SLM color microscopic images with various magnifications. This method can filter noise from SLM color microscopic images effectively and detect satisfactory edge. Moreover, the method is applied to images with simulated noise and real images. The experiment results are given at the end.

Key words: Wavelet transformation  HSI color space  Sub-pixel edge detection  Cubic spline  Color microscopic image

CLC No: TP391

国家自然科学基金(50275023)和国家自然科学重点基金(50135040)资助项目. Received 20040312, received in revised form 20040830

 
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