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  HomeContents of Chinese Journal of Mechanical Engineering 2005 No.4ULTRA-PRECISION ALIGNMENT BASED ON DIFFERENTIAL MOIRE TECHNIQUE
ULTRA-PRECISION ALIGNMENT BASED ON

DIFFERENTIAL MOIRE TECHNIQUE

 

Wang Li  Lu Bingheng  Ding Yucheng  Liu Hongzhong

(State Key Laboratory of Manufacturing Systems Engineering, Xi’an Jiaotong University, Xi’an  710049)

 

Abstract: An ultra-precision alignment technique based on differential moiré technique is presented for room- temperature imprint lithography. The Moiré signal generated by a pair of special slant gratings is detected by a set of photoelectric detectors then the detected signals are used to estimate the magnitudes of misalignment in x, y directions. The test results conformed that differential moiré signal is more sensitive than simple moiré signal. Additionally, a Chebyshev digital filter is adopted in control system to reduce the noise from the differential moiré signals. As a result, the repeatable alignment accuracy can reach ±20 nm and meet the requirement of alignment accuracy for sub-100 nm imprint lithography.

Key words: Imprint lithography  Grating  Differential moiré signal  Ultra-precision alignment

CLC No: TH74  TN247

国家自然科学基金 (50275118)、国家863计划重点(2002AA420050)和国家重点基础研究发展计划(2003CB716203)资助项目. Received 20040621, received in revised form 20050110

 
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