Home|News|Literature|Journal|Instruction|Forum|Member|Introduction

Chinese  Old version

By    In    Search 

  HomeContents of Chinese Journal of Mechanical Engineering 2005 No.6Effect of Stresses on Micromachined z-Axis Vibrating Rate Gyroscope

Effect of Stresses on Micromachined

z-Axis Vibrating Rate Gyroscope

 

Qiu Anping  Su Yan  Wang Shourong  Zhou Bailing

(Department of Instrument Science & Engineering, Southeast University, Nanjing 210096)

 

Abstract: Micromachined z-axis vibrating rate gyroscopes we design are fabricated by the dissolved wafer process (DWP). Residual stresses are developed in mechanical parts of gyroscopes due to the fabrication process. The effect of residual stresses on the natural frequencies of the drive mode and sense mode is theoretically analyzed. Then, the FE model of the z-axis gyroscope is built to simulate the relation of the frequencies and residual stress by model analysis. The simulation results and experiments demonstrate that the outer flexure beams fabricated by DWP are subjected to tensile force, and the tensile stress value is about 20~30 MPa. The methods of the residual stress relief are presented and an improved z-axis gyroscope is designed. The experiment results of the improved z-axis gyroscope demonstrate that the performance of the gyroscopes with serpentine beams and stress relief slots will greatly improve.

Key words: Residual stresses  Mechanical sensitivity  Serpentine beam   Stress relief slot

CLC No: U666.12

Received 20040406, received in revised form 20050107

  

Open or Download Full Text of this Paper (PDF File)
 
  About us-Contact us-Site map-Advertisement service-Cooperation-Legal statement  

Address: 22 Baiwanzhuang Dajie, Beijing 100037 China    Tel: 8610-88379907    Fax: 8610-68994557

E-mail: cjme@mail.machineinfo.gov.cn  http: //www.cjmenet.com
©2006 Editorial Office of CJME. All Right Reserved