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  HomeContents of Chinese Journal of Mechanical Engineering (English Edition),2001 No.3NEW TECHNOLOGY FOR FAULT DIAGNOSIS BASED ON WAVELET DENOISING AND MODIFIED EXPONENTIAL TIME-FREQUENCY DISTRIBUTION
NEW TECHNOLOGY FOR FAULT DIAGNOSIS BASED ON WAVELET DENOISING AND MODIFIED EXPONENTIAL

TIME-FREQUENCY DISTRIBUTION

 

Wang Xinqing  Wang Yaohua  Qian Shuhua  Chen Liuhai
 Engineering College of PLA University of Science and Technology
Xu Yanshen  Zhao Xiangsong

Tianjin University

 

Abstract: Fast wavelet multi-resolution analysis (wavelet MRA) provides a effective tool for analyzing and canceling disturbing components in original signal. Because of its exponential frequency axis, the method isn't suitable for extracting harmonic components. The modified exponential time-frequency distribution (MED) overcomes the problems of Wigner distribution (WD), can suppress cross-terms and cancel noise further more. MED provides high resolution in both time and frequency domains, so it can make out weak period impulse components from signal with mighty harmonic components. According to the "time" behavior, together with "frequency" behavior in one figure, the essential structure of a signal is revealed clearly. According to the analysis of algorithm and fault diagnosis example, the joint of wavelet MRA and MED is a powerful tool for fault diagnosis.

Key words: Wavelet multi-resolution analysis  Denoising  Modified exponential distribution  Fault diagnosis


Manuscript received on June 27, 2000; revised manuscript November 20, 2000

 

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