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  HomeContents of Chinese Journal of Mechanical Engineering (English Edition),2001 No.4RESEARCH ON A SCANNING NEAR-FIELD MICROSCOPY BASED ON A QUARTZ RESONATOR
 RESEARCH ON A SCANNING NEAR-FIELD MICROSCOPY BASED ON A QUARTZ RESONATOR*

 

Wang Xuefang  Zhang Honghai  Zeng Lingdan
School of Mechanical Engineering, Huazhong University of Science and Technology

 

Abstract: A scanning near-field acoustic microscopy (SNAM) used in imaging the topography of precise surfaces is presented. As a micro-force sensor, a non-encapsulated 1 MHz quartz resonator is damped by hydrodynamic forces when approaching an object. Thus the oscillating characteristics of the leg of the quartz resonator change. While measuring the decrease of the amplitude of vibrating ,the shape of the object can be obtained. Based on the analyses of the principle and key parameters of SNAM, a SNAM is exploited. A lateral resolution of 0.5m and vertical resolution of 2 nm has been achieved in the experiments.

Key words: Scanning near-field microscopy  Quartz resonator  Resolution


* This project is supported by Doctor Grant of National Education Ministry (No.97048707).  Manuscript received on June 16, 2000; revised manuscript April 12, 2001

 

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