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  HomeContents of Chinese Journal of Mechanical Engineering (English Edition),2005 No.1MORPHOLOGY CONTROL OF ULTRAFINE CeO2 AND ITS POLISHING EFFICACY

Chen Jianqing

College of Materials Science
and Technology,
Jiangsu University,
Zhenjiang 212013, China

 

Chen Zhigang

 

Li Jinchun

Department of Information Science, Jiangsu Polytechnique University, Changzhou 213016, China

 

 

MORPHOLOGY CONTROL OF

ULTRAFINE CeO2 AND ITS
POLISHING EFFICACY*


Abstract: Homogenous precipitation and subsequent calcination has been used to synthesize ultrafine ceria from cerium nitrate and urea solution. The ceria calcined from the precursor inherit the size and morphology of it. The size and morphology of the precursor are closely related to the preparation process. The morphology, size and distribution of the precursor could be tailored by changing the reaction condition and the ageing time. Monodispersed 200 nm sized spherical particles is prepared by this method. The powder is used in the chemical-mechanical polishing of Si wafer. The average surface roughness of the polished Si wafer is 0.171 nm measured by AFM.

Key words: Cerium dioxide (CeO2) precursor  Homogenous precipitation  Ageing time  Chemical-mechanical polishing (CMP)

 


* This project is supported by Provincial Natural Science Foundation of Jiangsu (No.BK2002010). Received June 30, 2003; received in revised form September 22, 2004; accepted November 10, 2004

 

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