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HE Shuguang
QI Ershi
HE Zhen
NIE Bin
School of Management,
Tianjin University,
Tianjin 300072, China
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QUALITY CONTROL OF SEMICONDUCTOR
PACKAGING BASED ON PRINCIPAL COMPONENTS ANALYSIS*
Abstract:
5 critical quality characteristics must be controlled in the surface mount and wire-bond process in semiconductor packaging. And these characteristics are correlated with each other. So the principal components analysis(PCA) is used in the analysis of the sample data firstly. And then the process is controlled with hotelling T2 control chart for the first several principal components which contain sufficient information. Furthermore, a software tool is developed for this kind of problems. And with sample data from a surface mounting device(SMD) process, it is demonstrated that the T2 control chart with PCA gets the same conclusion as without PCA, but the problem is transformed from high-dimensional one to a lower dimensional one, i.e., from 5 to 2 in this demonstration.
Key words:
Semiconductor packaging Principal components analysis Quality control |